Querying Labeled Time Series Data with Scenario Programs

Fuente: arXiv
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Main Authors: Kim, Edward, Shanker, Devan, Bharadwaj, Varun, Park, Hongbeen, Kim, Jinkyu, Torfah, Hazem, Fremont, Daniel J, Seshia, Sanjit A
Format: Preprint
Published: 2025
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_version_ 1866915615973834752
author Kim, Edward
Shanker, Devan
Bharadwaj, Varun
Park, Hongbeen
Kim, Jinkyu
Torfah, Hazem
Fremont, Daniel J
Seshia, Sanjit A
author_facet Kim, Edward
Shanker, Devan
Bharadwaj, Varun
Park, Hongbeen
Kim, Jinkyu
Torfah, Hazem
Fremont, Daniel J
Seshia, Sanjit A
contents Simulation-based testing has become a crucial complement to road testing for ensuring the safety of cyber physical systems (CPS). As a result, significant research efforts have been directed toward identifying failure scenarios within simulation environments. However, a critical question remains. Are the AV failure scenarios discovered in simulation reproducible on actual systems in the real world? The sim-to-real gap caused by differences between simulated and real sensor data means that failure scenarios identified in simulation might either be artifacts of synthetic sensor data or actual issues that also occur with real sensor data. To address this, an effective approach to validating simulated failure scenarios is to locate occurrences of these scenarios within real-world datasets and verify whether the failure persists on the datasets. To this end, we introduce a formal definition of how labeled time series sensor data can match an abstract scenario, represented as a scenario program using the Scenic probabilistic programming language. We present a querying algorithm that, given a scenario program and a labeled dataset, identifies the subset of data that matches the specified scenario. Our experiment shows that our algorithm is more accurate and orders of magnitude faster in querying scenarios than the state-of-the-art commercial vision large language models, and can scale with the duration of queried time series data.
format Preprint
id arxiv_https___arxiv_org_abs_2511_10627
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Querying Labeled Time Series Data with Scenario Programs
Kim, Edward
Shanker, Devan
Bharadwaj, Varun
Park, Hongbeen
Kim, Jinkyu
Torfah, Hazem
Fremont, Daniel J
Seshia, Sanjit A
Artificial Intelligence
Computer Vision and Pattern Recognition
Formal Languages and Automata Theory
Machine Learning
Simulation-based testing has become a crucial complement to road testing for ensuring the safety of cyber physical systems (CPS). As a result, significant research efforts have been directed toward identifying failure scenarios within simulation environments. However, a critical question remains. Are the AV failure scenarios discovered in simulation reproducible on actual systems in the real world? The sim-to-real gap caused by differences between simulated and real sensor data means that failure scenarios identified in simulation might either be artifacts of synthetic sensor data or actual issues that also occur with real sensor data. To address this, an effective approach to validating simulated failure scenarios is to locate occurrences of these scenarios within real-world datasets and verify whether the failure persists on the datasets. To this end, we introduce a formal definition of how labeled time series sensor data can match an abstract scenario, represented as a scenario program using the Scenic probabilistic programming language. We present a querying algorithm that, given a scenario program and a labeled dataset, identifies the subset of data that matches the specified scenario. Our experiment shows that our algorithm is more accurate and orders of magnitude faster in querying scenarios than the state-of-the-art commercial vision large language models, and can scale with the duration of queried time series data.
title Querying Labeled Time Series Data with Scenario Programs
topic Artificial Intelligence
Computer Vision and Pattern Recognition
Formal Languages and Automata Theory
Machine Learning
url https://arxiv.org/abs/2511.10627