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STEM EBIC as a Quantitative Probe of Semiconductor Devices

Fuente: arXiv

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Bibliographic Details
Main Authors:	Schneider, Sebastian, Beckert, Sebastian, Hammer, René, König, Markus, Moldovan, Grigore, Pohl, Darius
Format:	Preprint
Published:	2025
Subjects:	Mesoscale and Nanoscale Physics Materials Science
Online Access:	Acceder al recurso
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