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| Main Authors: | , , , , |
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| Format: | Preprint |
| Published: |
2025
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2511.11739 |
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| _version_ | 1866915619167797248 |
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| author | Schenk, Christina Hernández-del-Valle, Miguel Calero-Lumbreras, Luis Noack, Marcus Haranczyk, Maciej |
| author_facet | Schenk, Christina Hernández-del-Valle, Miguel Calero-Lumbreras, Luis Noack, Marcus Haranczyk, Maciej |
| contents | Device-to-device variability in experimental noise critically impacts reproducibility, especially in automated, high-throughput systems like additive manufacturing farms. While manageable in small labs, such variability can escalate into serious risks at larger scales, such as architectural 3D printing, where noise may cause structural or economic failures. This contribution presents a noise-aware decision-making algorithm that quantifies and models device-specific noise profiles to manage variability adaptively. It uses distributional analysis and pairwise divergence metrics with clustering to choose between single-device and robust multi-device Bayesian optimization strategies. Unlike conventional methods that assume homogeneous devices or generic robustness, this framework explicitly leverages inter-device differences to enhance performance, reproducibility, and efficiency. An experimental case study involving three nominally identical 3D printers (same brand, model, and close serial numbers) demonstrates reduced redundancy, lower resource usage, and improved reliability. Overall, this framework establishes a paradigm for precision- and resource-aware optimization in scalable, automated experimental platforms. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2511_11739 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Noise-Aware Optimization in Nominally Identical Manufacturing and Measuring Systems for High-Throughput Parallel Workflows Schenk, Christina Hernández-del-Valle, Miguel Calero-Lumbreras, Luis Noack, Marcus Haranczyk, Maciej Distributed, Parallel, and Cluster Computing Materials Science Machine Learning Optimization and Control Computation Device-to-device variability in experimental noise critically impacts reproducibility, especially in automated, high-throughput systems like additive manufacturing farms. While manageable in small labs, such variability can escalate into serious risks at larger scales, such as architectural 3D printing, where noise may cause structural or economic failures. This contribution presents a noise-aware decision-making algorithm that quantifies and models device-specific noise profiles to manage variability adaptively. It uses distributional analysis and pairwise divergence metrics with clustering to choose between single-device and robust multi-device Bayesian optimization strategies. Unlike conventional methods that assume homogeneous devices or generic robustness, this framework explicitly leverages inter-device differences to enhance performance, reproducibility, and efficiency. An experimental case study involving three nominally identical 3D printers (same brand, model, and close serial numbers) demonstrates reduced redundancy, lower resource usage, and improved reliability. Overall, this framework establishes a paradigm for precision- and resource-aware optimization in scalable, automated experimental platforms. |
| title | Noise-Aware Optimization in Nominally Identical Manufacturing and Measuring Systems for High-Throughput Parallel Workflows |
| topic | Distributed, Parallel, and Cluster Computing Materials Science Machine Learning Optimization and Control Computation |
| url | https://arxiv.org/abs/2511.11739 |