Uncertainty-Guided Live Measurement Sequencing for Fast SAR ADC Linearity Testing

Fuente: arXiv

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Bibliographic Details
Main Authors:	Schey, Thorben, Karoonlatifi, Khaled, Weyrich, Michael, Morozov, Andrey
Format:	Preprint
Published:	2025
Subjects:	Hardware Architecture
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2511.11895