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Uncertainty-Guided Live Measurement Sequencing for Fast SAR ADC Linearity Testing

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Schey, Thorben, Karoonlatifi, Khaled, Weyrich, Michael, Morozov, Andrey
Natura:	Preprint
Pubblicazione:	2025
Soggetti:	Hardware Architecture
Accesso online:	Acceder al recurso
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