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Uncertainty-Guided Live Measurement Sequencing for Fast SAR ADC Linearity Testing

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Schey, Thorben, Karoonlatifi, Khaled, Weyrich, Michael, Morozov, Andrey
Format:	Preprint
Publié:	2025
Sujets:	Hardware Architecture
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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