Large Language Models Meet Extreme Multi-label Classification: Scaling and Multi-modal Framework

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ortego, Diego, Rodríguez, Marlon, Almagro, Mario, Dahiya, Kunal, Jiménez, David, SanMiguel, Juan C.
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Information Retrieval
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2511.13189