Variable-temperature attenuator calibration method for on-wafer microwave noise characterization of low-noise amplifiers

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ardizzi, Anthony J., Zhang, Jiayin, Babenko, Akim A., Cleary, Kieran A., Minnich, Austin J.
Format:	Preprint
Published:	2025
Subjects:	Instrumentation and Detectors Instrumentation and Methods for Astrophysics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2511.13619