Ellipsometric Identification of Transition from Layered Metal-dielectric Film to Hyperbolic Metamaterial

Fuente: arXiv
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Main Authors: Kattekola, Samhita, Menon, Vinod, Couzis, Alexander, Kretzschmar, Ilona
Format: Preprint
Published: 2025
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author Kattekola, Samhita
Menon, Vinod
Couzis, Alexander
Kretzschmar, Ilona
author_facet Kattekola, Samhita
Menon, Vinod
Couzis, Alexander
Kretzschmar, Ilona
contents Hyperbolic Metamaterials (HMMs) continue to be intriguing due to their applications in super resolution imaging and spontaneous emission control. One of the successful realizations of HMMs is a layered metal-dielectric film. Despite the extensive knowledge in thin film technology and the promises of HMM's applications, the scale up and practical utilization of HMMs have not yet occurred. A general design approach is needed to predict the transition of a layered structure into an HMM. In this work, effective medium approximation and transfer matrix method are combined to determine the transition and validated by spectroscopic ellipsometry measurements on a predefined HMM structure made of silver and alumina. Four interdependent design parameters are explored: thicknesses of metal and dielectric layers, transition wavelength, and minimum number of periods required for a layered metal-dielectric film to display hyperbolic dispersion. The findings are presented as a practical engineering design chart, similar to a state diagram, that can be extended to other combinations of materials.
format Preprint
id arxiv_https___arxiv_org_abs_2511_13991
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Ellipsometric Identification of Transition from Layered Metal-dielectric Film to Hyperbolic Metamaterial
Kattekola, Samhita
Menon, Vinod
Couzis, Alexander
Kretzschmar, Ilona
Optics
Materials Science
Hyperbolic Metamaterials (HMMs) continue to be intriguing due to their applications in super resolution imaging and spontaneous emission control. One of the successful realizations of HMMs is a layered metal-dielectric film. Despite the extensive knowledge in thin film technology and the promises of HMM's applications, the scale up and practical utilization of HMMs have not yet occurred. A general design approach is needed to predict the transition of a layered structure into an HMM. In this work, effective medium approximation and transfer matrix method are combined to determine the transition and validated by spectroscopic ellipsometry measurements on a predefined HMM structure made of silver and alumina. Four interdependent design parameters are explored: thicknesses of metal and dielectric layers, transition wavelength, and minimum number of periods required for a layered metal-dielectric film to display hyperbolic dispersion. The findings are presented as a practical engineering design chart, similar to a state diagram, that can be extended to other combinations of materials.
title Ellipsometric Identification of Transition from Layered Metal-dielectric Film to Hyperbolic Metamaterial
topic Optics
Materials Science
url https://arxiv.org/abs/2511.13991