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Observation of the surface hybridization gap in the electrical transport properties of the ultrathin topological insulator (Bi$_{1-x}$Sb$_{x}$)$_2$Te$_3$

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	van Veen, Feike, Kölling, Sofie, de Wit, Stijn R., Metsch, Roel, Rosenbach, Daniel, Li, Chuan, Brinkman, Alexander
Formato:	Preprint
Publicado:	2025
Materias:	Mesoscale and Nanoscale Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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