2D-RIXS: Resonant inelastic x-ray scattering microscopy with high energy and spatial resolutions
Fuente:
arXiv
Guardado en:
| Autores principales: | , , |
|---|---|
| Formato: | Preprint |
| Publicado: |
2025
|
| Materias: | |
| Acceso en línea: | |
| Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
| _version_ | 1866917462721691648 |
|---|---|
| author | Yamamoto, Kohei Suzuki, Hakuto Miyawaki, Jun |
| author_facet | Yamamoto, Kohei Suzuki, Hakuto Miyawaki, Jun |
| contents | A two-dimensional resonant inelastic x-ray scattering (2D-RIXS) microscopy system has been developed at the beamline BL02U of NanoTerasu. The instrument combines a Wolter type-I mirror for spatial imaging with a varied-line-spacing grating spectrometer, simultaneously achieving micrometer-scale spatial resolution and ultrahigh energy resolution in the soft x-ray regime. Test chart measurements confirm a vertical spatial resolution of 1.0 um near the field-of-view center, and the horizontal resolution determined by the incident beam footprint is 0.8 um. RIXS imaging capabilities have been demonstrated by the measurements of a patterned NanoTerasu logo and exfoliated NiPS${}_3$ nanoflakes, highlighting its efficiency in locating specific microscale regions within inhomogeneous samples. These results establish 2D-RIXS microscopy as a position-sensitive probe of elementary excitations in quantum materials and functional devices. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2511_17966 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | 2D-RIXS: Resonant inelastic x-ray scattering microscopy with high energy and spatial resolutions Yamamoto, Kohei Suzuki, Hakuto Miyawaki, Jun Materials Science A two-dimensional resonant inelastic x-ray scattering (2D-RIXS) microscopy system has been developed at the beamline BL02U of NanoTerasu. The instrument combines a Wolter type-I mirror for spatial imaging with a varied-line-spacing grating spectrometer, simultaneously achieving micrometer-scale spatial resolution and ultrahigh energy resolution in the soft x-ray regime. Test chart measurements confirm a vertical spatial resolution of 1.0 um near the field-of-view center, and the horizontal resolution determined by the incident beam footprint is 0.8 um. RIXS imaging capabilities have been demonstrated by the measurements of a patterned NanoTerasu logo and exfoliated NiPS${}_3$ nanoflakes, highlighting its efficiency in locating specific microscale regions within inhomogeneous samples. These results establish 2D-RIXS microscopy as a position-sensitive probe of elementary excitations in quantum materials and functional devices. |
| title | 2D-RIXS: Resonant inelastic x-ray scattering microscopy with high energy and spatial resolutions |
| topic | Materials Science |
| url | https://arxiv.org/abs/2511.17966 |