Guardado en:
| Autores principales: | , , |
|---|---|
| Formato: | Preprint |
| Publicado: |
2025
|
| Materias: | |
| Acceso en línea: | https://arxiv.org/abs/2511.17966 |
| Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
Tabla de Contenidos:
- A two-dimensional resonant inelastic x-ray scattering (2D-RIXS) microscopy system has been developed at the beamline BL02U of NanoTerasu. The instrument combines a Wolter type-I mirror for spatial imaging with a varied-line-spacing grating spectrometer, simultaneously achieving micrometer-scale spatial resolution and ultrahigh energy resolution in the soft x-ray regime. Test chart measurements confirm a vertical spatial resolution of 1.0 um near the field-of-view center, and the horizontal resolution determined by the incident beam footprint is 0.8 um. RIXS imaging capabilities have been demonstrated by the measurements of a patterned NanoTerasu logo and exfoliated NiPS${}_3$ nanoflakes, highlighting its efficiency in locating specific microscale regions within inhomogeneous samples. These results establish 2D-RIXS microscopy as a position-sensitive probe of elementary excitations in quantum materials and functional devices.