APA (7th ed.) Citation

Gabielkov, S. V., Zhyganiuk, I. V., Skorbun, A. D., Kudlai, V. G., Savchenko, B. S., Parkhomchuk, P. E., & Chikolovets, S. O. (2025). Possibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component.

Chicago Style (17th ed.) Citation

Gabielkov, S. V., I. V. Zhyganiuk, A. D. Skorbun, V. G. Kudlai, B. S. Savchenko, P. E. Parkhomchuk, and S. O. Chikolovets. Possibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component. 2025.

MLA (9th ed.) Citation

Gabielkov, S. V., et al. Possibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component. 2025.