APA-Zitierstil (7. Ausg.)

Gabielkov, S. V., Zhyganiuk, I. V., Skorbun, A. D., Kudlai, V. G., Savchenko, B. S., Parkhomchuk, P. E., & Chikolovets, S. O. (2025). Possibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component.

Chicago-Zitierstil (17. Ausg.)

Gabielkov, S. V., I. V. Zhyganiuk, A. D. Skorbun, V. G. Kudlai, B. S. Savchenko, P. E. Parkhomchuk, und S. O. Chikolovets. Possibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component. 2025.

MLA-Zitierstil (9. Ausg.)

Gabielkov, S. V., et al. Possibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component. 2025.