Gespeichert in:
| Hauptverfasser: | , , , , , , |
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| Format: | Preprint |
| Veröffentlicht: |
2025
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| Schlagworte: | |
| Online-Zugang: | https://arxiv.org/abs/2511.18311 |
| Tags: |
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Inhaltsangabe:
- The values of the signal-to-noise ratio are determined, at which the method of processing X-ray diffraction data reveals reflections with intensity less than the noise component of the background. The possibilities of the method are demonstrated on weak reflections of $α$-quartz. The method of processing X-ray diffraction data makes it possible to increase the possibilities of X-ray phase analysis in determining the qualitative phase composition of multiphase materials with a small (down to $0.1$ wt. \%) content of several (up to eight) phases.