Beyond the ACE Score: Replicable Combinations of Adverse Childhood Experiences That Worsen Depression Risk

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhang, Ruizhe, Kong, Jooyoung, Small, Dylan S., Bekerman, William
Format:	Preprint
Published:	2025
Subjects:	Applications Methodology
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2511.19574