Chun, I., Lee, S., Albergo, M. S., Xie, S., & Vanden-Eijnden, E. (2025). Dynamic Test-Time Compute Scaling in Control Policy: Difficulty-Aware Stochastic Interpolant Policy.
Chicago Style (17th ed.) CitationChun, Inkook, Seungjae Lee, Michael S. Albergo, Saining Xie, and Eric Vanden-Eijnden. Dynamic Test-Time Compute Scaling in Control Policy: Difficulty-Aware Stochastic Interpolant Policy. 2025.
MLA (9th ed.) CitationChun, Inkook, et al. Dynamic Test-Time Compute Scaling in Control Policy: Difficulty-Aware Stochastic Interpolant Policy. 2025.
Warning: These citations may not always be 100% accurate.