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Bibliographic Details
Main Authors: Rao, Junhui, Liu, Yi, Zhang, Jichen, Ming, Zhaoyang, Qiao, Tianrui, Zhang, Yujie, Chiu, Chi Yuk, Wang, Hua, Murch, Ross
Format: Preprint
Published: 2025
Subjects:
Online Access:https://arxiv.org/abs/2511.21274
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Table of Contents:
  • This paper proposes a novel analytical framework, termed the Multiport Analytical Pixel Electromagnetic Simulator (MAPES). MAPES enables efficient and accurate prediction of the electromagnetic (EM) performance of arbitrary pixel-based microwave (MW) and RFIC structures. Inspired by the Integrated Internal Multiport Method (IMPM), MAPES extends the concept to the pixel presence/absence domain used in AI-assisted EM design. By introducing virtual pixels and diagonal virtual pixels and inserting virtual ports at critical positions, MAPES captures all horizontal, vertical, and diagonal electromagnetic couplings within a single multiport impedance matrix. Only a small set of full-wave simulations (typically about 1% of the datasets required by AI-assisted EM simulators) is needed to construct this matrix. Subsequently, any arbitrary pixel configuration can be evaluated analytically using a closed-form multiport relation without additional full-wave calculations. The proposed approach eliminates data-driven overfitting and ensures accurate results across all design variations. Comprehensive examples for single- and double-layer CMOS processes (180 nm and 65 nm) and PCBs confirm that MAPES achieves high prediction accuracy with 600- 2000x speed improvement compared to CST simulations. Owing to its efficiency, scalability and reliability, MAPES provides a practical and versatile tool for AI-assisted MW circuit and RFIC design across diverse fabrication technologies.