White light interferometry analysis for measuring thin film thickness down to few nanometers

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ziapkoff, Victor, Boulogne, François, Salonen, Anniina, Rio, Emmanuelle
Format:	Preprint
Published:	2025
Subjects:	Optics Soft Condensed Matter
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2511.21383