Formation of Light-Emitting Defects in Ag-based Memristors

Fuente: arXiv
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Main Authors: Singh, Diana, Ćwierzona, Maciej, Parvaud, Régis, Maćkowski, Sebastian, Bouhelier, Alexandre
Format: Preprint
Published: 2025
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author Singh, Diana
Ćwierzona, Maciej
Parvaud, Régis
Maćkowski, Sebastian
Bouhelier, Alexandre
author_facet Singh, Diana
Ćwierzona, Maciej
Parvaud, Régis
Maćkowski, Sebastian
Bouhelier, Alexandre
contents Optical memristors are innovative devices that enable the integration of electro-optical functionalities - such as light modulation, multilevel optical memory, and nonvolatile reprogramming - into neuromorphic networks. Recently, their capabilities have expanded with the development of light-emitting memristors, which operate through various emission mechanisms. One notable process involves the electroluminescence of defects generated within the switching matrix during device activation. In this study, we explore the early-stage formation and evolution of the species responsible for light emission in Ag-based in-plane memristors. Our approach combines electrical stimulation with correlated optical electroluminescence and photoluminescence measurements. The findings provide valuable insights into controlling emission processes in memristors, paving the way for their integration as essential components in neuromorphic circuits.
format Preprint
id arxiv_https___arxiv_org_abs_2511_21555
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Formation of Light-Emitting Defects in Ag-based Memristors
Singh, Diana
Ćwierzona, Maciej
Parvaud, Régis
Maćkowski, Sebastian
Bouhelier, Alexandre
Mesoscale and Nanoscale Physics
Optical memristors are innovative devices that enable the integration of electro-optical functionalities - such as light modulation, multilevel optical memory, and nonvolatile reprogramming - into neuromorphic networks. Recently, their capabilities have expanded with the development of light-emitting memristors, which operate through various emission mechanisms. One notable process involves the electroluminescence of defects generated within the switching matrix during device activation. In this study, we explore the early-stage formation and evolution of the species responsible for light emission in Ag-based in-plane memristors. Our approach combines electrical stimulation with correlated optical electroluminescence and photoluminescence measurements. The findings provide valuable insights into controlling emission processes in memristors, paving the way for their integration as essential components in neuromorphic circuits.
title Formation of Light-Emitting Defects in Ag-based Memristors
topic Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2511.21555