Smarter, not Bigger: Fine-Tuned RAG-Enhanced LLMs for Automotive HIL Testing

Fuente: arXiv
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Bibliographic Details
Main Authors: Feng, Chao, Liu, Zihan, Gupta, Siddhant, Cui, Gongpei, von der Assen, Jan, Stiller, Burkhard
Format: Preprint
Published: 2025
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