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| Main Authors: | , , , , , |
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| Format: | Preprint |
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2025
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2511.22909 |
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| _version_ | 1866911484181741568 |
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| author | Yamagami, Kohei Yokoyama, Yuichi Sumiya, Yuta Shouno, Hayaru Nakamura, Tetsuro Mizumaki, Masaichiro |
| author_facet | Yamagami, Kohei Yokoyama, Yuichi Sumiya, Yuta Shouno, Hayaru Nakamura, Tetsuro Mizumaki, Masaichiro |
| contents | Soft X-ray angle resolved photoemission spectroscopy (SX-ARPES) is one of the most powerful spectroscopic techniques to visualize the three-dimensional bulk electronic structure in reciprocal lattice space. Compared with ARPES employing low-energy photon sources, the time burden imposed by a lower photoelectron yield, stemming from the photoionization cross-section, has been a persistent technical challenge. To address this challenge, we have developed a noise removal system by using the deep prior-based method and integrated it into the micro focused SX-ARPES (μSX-ARPES) system at BL25SU in SPring-8. Our implemented system effectively eliminates the grid and spike noise typically present in ARPES data acquired using the voltage Fixed-mode, within about 30 seconds. We demonstrate, through the μSX-ARPES measurements on a single crystal of CeRu2Si2, that data with sufficient statistical accuracy can be obtained in approximately 40 seconds. In addition, we present the potential of high signal-to-noise ratio ARPES measurement, achieving an energy resolution of 51.6 meV at an excitation energy of 708 eV in μSX-ARPES measurements on polycrystalline gold. Our developed system successfully reduces the time burden in SX-ARPES and paves the way for advancements in lower photoelectron yield measurements, such as those requiring higher energy resolution and three-dimensional nonequilibrium measurements. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2511_22909 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Development of ultra-high efficiency soft X-ray angle-resolved photoemission spectroscopy equipped with deep prior-based denoising method Yamagami, Kohei Yokoyama, Yuichi Sumiya, Yuta Shouno, Hayaru Nakamura, Tetsuro Mizumaki, Masaichiro Strongly Correlated Electrons Materials Science 68T07, 68U10, 62-XX I.2.10; I.4.4; I.5.1 Soft X-ray angle resolved photoemission spectroscopy (SX-ARPES) is one of the most powerful spectroscopic techniques to visualize the three-dimensional bulk electronic structure in reciprocal lattice space. Compared with ARPES employing low-energy photon sources, the time burden imposed by a lower photoelectron yield, stemming from the photoionization cross-section, has been a persistent technical challenge. To address this challenge, we have developed a noise removal system by using the deep prior-based method and integrated it into the micro focused SX-ARPES (μSX-ARPES) system at BL25SU in SPring-8. Our implemented system effectively eliminates the grid and spike noise typically present in ARPES data acquired using the voltage Fixed-mode, within about 30 seconds. We demonstrate, through the μSX-ARPES measurements on a single crystal of CeRu2Si2, that data with sufficient statistical accuracy can be obtained in approximately 40 seconds. In addition, we present the potential of high signal-to-noise ratio ARPES measurement, achieving an energy resolution of 51.6 meV at an excitation energy of 708 eV in μSX-ARPES measurements on polycrystalline gold. Our developed system successfully reduces the time burden in SX-ARPES and paves the way for advancements in lower photoelectron yield measurements, such as those requiring higher energy resolution and three-dimensional nonequilibrium measurements. |
| title | Development of ultra-high efficiency soft X-ray angle-resolved photoemission spectroscopy equipped with deep prior-based denoising method |
| topic | Strongly Correlated Electrons Materials Science 68T07, 68U10, 62-XX I.2.10; I.4.4; I.5.1 |
| url | https://arxiv.org/abs/2511.22909 |