Zero-Shot Multi-Criteria Visual Quality Inspection for Semi-Controlled Industrial Environments via Real-Time 3D Digital Twin Simulation
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arXiv
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| Auteurs principaux: | , , , , , , |
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| Format: | Preprint |
| Publié: |
2025
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| _version_ | 1866915643476934656 |
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| author | Araya-Martinez, Jose Moises Mohan, Gautham Bolaños, Kenichi Hayakawa Mendieta, Roberto Sardari, Sarvenaz Lambrecht, Jens Krüger, Jörg |
| author_facet | Araya-Martinez, Jose Moises Mohan, Gautham Bolaños, Kenichi Hayakawa Mendieta, Roberto Sardari, Sarvenaz Lambrecht, Jens Krüger, Jörg |
| contents | Early-stage visual quality inspection is vital for achieving Zero-Defect Manufacturing and minimizing production waste in modern industrial environments. However, the complexity of robust visual inspection systems and their extensive data requirements hinder widespread adoption in semi-controlled industrial settings. In this context, we propose a pose-agnostic, zero-shot quality inspection framework that compares real scenes against real-time Digital Twins (DT) in the RGB-D space. Our approach enables efficient real-time DT rendering by semantically describing industrial scenes through object detection and pose estimation of known Computer-Aided Design models. We benchmark tools for real-time, multimodal RGB-D DT creation while tracking consumption of computational resources. Additionally, we provide an extensible and hierarchical annotation strategy for multi-criteria defect detection, unifying pose labelling with logical and structural defect annotations. Based on an automotive use case featuring the quality inspection of an axial flux motor, we demonstrate the effectiveness of our framework. Our results demonstrate detection performace, achieving intersection-over-union (IoU) scores of up to 63.3% compared to ground-truth masks, even if using simple distance measurements under semi-controlled industrial conditions. Our findings lay the groundwork for future research on generalizable, low-data defect detection methods in dynamic manufacturing settings. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2511_23214 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Zero-Shot Multi-Criteria Visual Quality Inspection for Semi-Controlled Industrial Environments via Real-Time 3D Digital Twin Simulation Araya-Martinez, Jose Moises Mohan, Gautham Bolaños, Kenichi Hayakawa Mendieta, Roberto Sardari, Sarvenaz Lambrecht, Jens Krüger, Jörg Computer Vision and Pattern Recognition 68T45 I.2.10 Early-stage visual quality inspection is vital for achieving Zero-Defect Manufacturing and minimizing production waste in modern industrial environments. However, the complexity of robust visual inspection systems and their extensive data requirements hinder widespread adoption in semi-controlled industrial settings. In this context, we propose a pose-agnostic, zero-shot quality inspection framework that compares real scenes against real-time Digital Twins (DT) in the RGB-D space. Our approach enables efficient real-time DT rendering by semantically describing industrial scenes through object detection and pose estimation of known Computer-Aided Design models. We benchmark tools for real-time, multimodal RGB-D DT creation while tracking consumption of computational resources. Additionally, we provide an extensible and hierarchical annotation strategy for multi-criteria defect detection, unifying pose labelling with logical and structural defect annotations. Based on an automotive use case featuring the quality inspection of an axial flux motor, we demonstrate the effectiveness of our framework. Our results demonstrate detection performace, achieving intersection-over-union (IoU) scores of up to 63.3% compared to ground-truth masks, even if using simple distance measurements under semi-controlled industrial conditions. Our findings lay the groundwork for future research on generalizable, low-data defect detection methods in dynamic manufacturing settings. |
| title | Zero-Shot Multi-Criteria Visual Quality Inspection for Semi-Controlled Industrial Environments via Real-Time 3D Digital Twin Simulation |
| topic | Computer Vision and Pattern Recognition 68T45 I.2.10 |
| url | https://arxiv.org/abs/2511.23214 |