M'sihid, E., Parizot, E., Battisti, M., & Blin, S. (2025). Statistical analysis and correction of the pile-up effect in MAPMT single photoelectron counting with the SPACIROC-3 ASIC: Application to the Mini-EUSO experiment.
Chicago Style (17th ed.) CitationM'sihid, Enzio, Etienne Parizot, Matteo Battisti, and Sylvie Blin. Statistical Analysis and Correction of the Pile-up Effect in MAPMT Single Photoelectron Counting with the SPACIROC-3 ASIC: Application to the Mini-EUSO Experiment. 2025.
MLA (9th ed.) CitationM'sihid, Enzio, et al. Statistical Analysis and Correction of the Pile-up Effect in MAPMT Single Photoelectron Counting with the SPACIROC-3 ASIC: Application to the Mini-EUSO Experiment. 2025.
Warning: These citations may not always be 100% accurate.