Analysis of Single Event Induced Bit Faults in a Deep Neural Network Accelerator Pipeline

Fuente: arXiv

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Bibliographic Details
Main Authors:	Jonckers, Naïn, Vinck, Toon, Karsmakers, Peter, Prinzie, Jeffrey
Format:	Preprint
Published:	2025
Subjects:	Hardware Architecture
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2512.00028