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| Main Authors: | , |
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| Format: | Preprint |
| Published: |
2025
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2512.02957 |
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Table of Contents:
- Self-testing constitutes one of the most powerful forms of device certification, enabling a complete and device-independent characterization of a quantum apparatus solely from the observed correlations. In recent work by the authors [23], a general framework was introduced for constructing Bell inequalities that self-test entire families of Clifford generators. In this manuscript, we develop an alternative and complementary self-testing criterion based on symmetric spanning sets. This formulation provides an explicit and constructive route to designing self-testing Bell inequalities in arbitrary dimensions.