Guo, J., Liu, S., Jing, B., He, Q., & Gessner, M. (2025). Metrological Sensitivity beyond Gaussian Limits with Cubic Phase States.
Cita Chicago Style (17a ed.)Guo, Jiajie, Shuheng Liu, Boxuan Jing, Qiongyi He, y Manuel Gessner. Metrological Sensitivity Beyond Gaussian Limits with Cubic Phase States. 2025.
Cita MLA (9a ed.)Guo, Jiajie, et al. Metrological Sensitivity Beyond Gaussian Limits with Cubic Phase States. 2025.
Precaución: Estas citas no son 100% exactas.