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Modelling the Impact of Device Imperfections on Electron Shuttling in SiMOS devices

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Turner, Jack J., Binder, Christian W., Burkard, Guido, Fisher, Andrew J.
Format:	Preprint
Publié:	2025
Sujets:	Quantum Physics Mesoscale and Nanoscale Physics
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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