Passive Silicon Nitride On-Chip Polarimetry: Precise Polarization Detection with Imperfect Components
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arXiv
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| Main Authors: | , , , , , |
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| Format: | Preprint |
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2025
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| _version_ | 1866915651705110528 |
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| author | Stockinger, Christoph Pruiti, Natale G. Tribaldo, Isaac Eismann, Jörg S. Sorel, Marc Banzer, Peter |
| author_facet | Stockinger, Christoph Pruiti, Natale G. Tribaldo, Isaac Eismann, Jörg S. Sorel, Marc Banzer, Peter |
| contents | Polarization is a fundamental property of light that carries distinct and valuable information. Consequently, its precise measurement is crucial for numerous applications, including biomedical imaging, remote sensing, and optical communication. Since polarization cannot be measured directly, it is typically inferred by converting it into intensity signals using dedicated optical elements. Conventional approaches, however, predominantly rely on bulky optical components, leading to considerably high fabrication costs and limited integration density. Here, we introduce a passive photonic integrated circuit capable of precisely determining the polarization state of visible free-space light. An silicon nitride on-chip architecture employing a compact polarization-splitting grating coupler and a set of passive interferometers encodes the polarization information into intensity signals, allowing conventional detectors to accurately reconstruct the polarization state. With increasing compactness of photonic components, however, susceptibility to fabrication tolerances as well as intrinsic design constraints increases, potentially leading to non\-/ideal behaviour. To address this, we introduce a robust calibration procedure that enables precise measurements even in the presence of imperfections. The chip design, combined with the calibration procedure, offers a robust, small-footprint, and high-speed approach to polarimetry, enabling a wide range of applications. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2512_03920 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Passive Silicon Nitride On-Chip Polarimetry: Precise Polarization Detection with Imperfect Components Stockinger, Christoph Pruiti, Natale G. Tribaldo, Isaac Eismann, Jörg S. Sorel, Marc Banzer, Peter Optics Applied Physics Polarization is a fundamental property of light that carries distinct and valuable information. Consequently, its precise measurement is crucial for numerous applications, including biomedical imaging, remote sensing, and optical communication. Since polarization cannot be measured directly, it is typically inferred by converting it into intensity signals using dedicated optical elements. Conventional approaches, however, predominantly rely on bulky optical components, leading to considerably high fabrication costs and limited integration density. Here, we introduce a passive photonic integrated circuit capable of precisely determining the polarization state of visible free-space light. An silicon nitride on-chip architecture employing a compact polarization-splitting grating coupler and a set of passive interferometers encodes the polarization information into intensity signals, allowing conventional detectors to accurately reconstruct the polarization state. With increasing compactness of photonic components, however, susceptibility to fabrication tolerances as well as intrinsic design constraints increases, potentially leading to non\-/ideal behaviour. To address this, we introduce a robust calibration procedure that enables precise measurements even in the presence of imperfections. The chip design, combined with the calibration procedure, offers a robust, small-footprint, and high-speed approach to polarimetry, enabling a wide range of applications. |
| title | Passive Silicon Nitride On-Chip Polarimetry: Precise Polarization Detection with Imperfect Components |
| topic | Optics Applied Physics |
| url | https://arxiv.org/abs/2512.03920 |