Cai, Z., Gernon, B., Bao, W., Li, Y., Wright, M., & Kong, Y. (2025). Open Set Face Forgery Detection via Dual-Level Evidence Collection.
Cita Chicago Style (17a ed.)Cai, Zhongyi, Bryce Gernon, Wentao Bao, Yifan Li, Matthew Wright, y Yu Kong. Open Set Face Forgery Detection via Dual-Level Evidence Collection. 2025.
Cita MLA (9a ed.)Cai, Zhongyi, et al. Open Set Face Forgery Detection via Dual-Level Evidence Collection. 2025.
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