Open Set Face Forgery Detection via Dual-Level Evidence Collection
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arXiv
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| Auteurs principaux: | , , , , , |
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| Format: | Preprint |
| Publié: |
2025
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| _version_ | 1866909048066015232 |
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| author | Cai, Zhongyi Gernon, Bryce Bao, Wentao Li, Yifan Wright, Matthew Kong, Yu |
| author_facet | Cai, Zhongyi Gernon, Bryce Bao, Wentao Li, Yifan Wright, Matthew Kong, Yu |
| contents | The surge in face forgeries has increasingly undermined confidence in the authenticity of online content. As generation algorithms rapidly evolve, new fake categories will constantly emerge, severely challenging existing face forgery detection methods. Although face forgery detection has recently improved, current techniques remain largely confined to binary Real-vs-Fake classification or the recognition of known fake categories. Moreover, they fail to identify the emergence of entirely new forgery methods. In this work, we study the Open Set Face Forgery Detection (OSFFD) problem, which requires the detection model to identify novel fake categories. To enhance its real-world applicability, we reformulate the OSFFD problem and address it through uncertainty estimation. Specifically, we propose the Dual-Level Evidential face forgery Detection (DLED) approach, which estimates prediction uncertainty by extracting and integrating category-specific evidence on the spatial and frequency levels. Comprehensive experiments across diverse settings demonstrate that our proposed DLED approach achieves state-of-the-art performance. Notably, it surpasses various existing baseline models by a $20\%$ margin on average when identifying forgeries from novel fake categories. Concurrently, our DLED method yields competitive performance on the standard binary Real-versus-Fake face forgery detection task. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2512_04331 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Open Set Face Forgery Detection via Dual-Level Evidence Collection Cai, Zhongyi Gernon, Bryce Bao, Wentao Li, Yifan Wright, Matthew Kong, Yu Computer Vision and Pattern Recognition The surge in face forgeries has increasingly undermined confidence in the authenticity of online content. As generation algorithms rapidly evolve, new fake categories will constantly emerge, severely challenging existing face forgery detection methods. Although face forgery detection has recently improved, current techniques remain largely confined to binary Real-vs-Fake classification or the recognition of known fake categories. Moreover, they fail to identify the emergence of entirely new forgery methods. In this work, we study the Open Set Face Forgery Detection (OSFFD) problem, which requires the detection model to identify novel fake categories. To enhance its real-world applicability, we reformulate the OSFFD problem and address it through uncertainty estimation. Specifically, we propose the Dual-Level Evidential face forgery Detection (DLED) approach, which estimates prediction uncertainty by extracting and integrating category-specific evidence on the spatial and frequency levels. Comprehensive experiments across diverse settings demonstrate that our proposed DLED approach achieves state-of-the-art performance. Notably, it surpasses various existing baseline models by a $20\%$ margin on average when identifying forgeries from novel fake categories. Concurrently, our DLED method yields competitive performance on the standard binary Real-versus-Fake face forgery detection task. |
| title | Open Set Face Forgery Detection via Dual-Level Evidence Collection |
| topic | Computer Vision and Pattern Recognition |
| url | https://arxiv.org/abs/2512.04331 |