Investigation of the Physical Mechanism behind Retention Loss in FeFETs with MIFIFIS Gate Structure
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arXiv
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| Main Authors: | Hu, Tao, Chen, Zeqi, Han, Runhao, Jia, Xinpei, Yang, Jia, Bai, Mingkai, Ji, Ruoyao, Ding, Yajing, Zhao, Mengwei, Li, Yuhan, Li, Kaiyi, Fan, Wenbo, Shao, Xianzhou, Sun, Xiaoqing, Han, Kai, Zhang, Jing, Wang, Yanrong, Chai, Junshuai, Xu, Hao, Wang, Xiaolei, Wang, Wenwu, Ye, Tianchun |
|---|---|
| Format: | Preprint |
| Published: |
2025
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