Finding the Maximal Contrast of Two Elliptical Gaussian Mode Beams with Aligned Ellipticities

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhu, Mark, Koehlenbeck, Sina M., Bonilla, Edgard, Lantz, Brian
Format:	Preprint
Published:	2025
Subjects:	Optics Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2512.05313