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Finding the Maximal Contrast of Two Elliptical Gaussian Mode Beams with Aligned Ellipticities

Fuente: arXiv

Enregistré dans:

Détails bibliographiques
Auteurs principaux:	Zhu, Mark, Koehlenbeck, Sina M., Bonilla, Edgard, Lantz, Brian
Format:	Preprint
Publié:	2025
Sujets:	Optics Instrumentation and Detectors
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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