Saved in:
| Main Authors: | , , , , , , , , , , |
|---|---|
| Format: | Preprint |
| Published: |
2025
|
| Subjects: | |
| Online Access: | https://arxiv.org/abs/2512.05322 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1866918233451266048 |
|---|---|
| author | Poem, E. Cohen, M. I. Blum, S. Minin, D. Korn, D. Heifler, O. Maayani, S. Hamo, A. Bayn, I. Bar-Gill, N. Tordjman, M. |
| author_facet | Poem, E. Cohen, M. I. Blum, S. Minin, D. Korn, D. Heifler, O. Maayani, S. Hamo, A. Bayn, I. Bar-Gill, N. Tordjman, M. |
| contents | High-fidelity quantum gates are a cornerstone of any quantum computing and communications architecture. Realizing such control in the presence of realistic errors at the level required for beyond-threshold quantum error correction is a long-standing challenge for all quantum hardware platforms. Here we theoretically develop and experimentally demonstrate error-protected quantum gates in a solid-state quantum network node. Our work combines room-temperature randomized benchmarking with a new class of composite pulses that are simultaneously robust to frequency and amplitude, affecting random and systematic errors. We introduce Power-Unaffected, Doubly-Detuning-Insensitive Gates (PUDDINGs) -- a theoretical framework for constructing conditional gates with immunity to both amplitude and frequency errors. For single-qubit and two-qubit CNOT gate demonstrations in a solid-state nitrogen-vacancy (NV) center in diamond, we systematically measure an improvement in the error per gate up to a factor of 9. By projecting the application of PUDDING to cryogenic temperatures we show a record two-qubit error per gate of $1.2 \times 10^{-5}$, corresponding to a fidelity of $99.9988\%$, far below the thresholds required by surface and color code error correction. These results present viable building blocks for a new class of fault-tolerant quantum networks and represent the first experimental realization of error-protected conditional gates in solid-state systems. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2512_05322 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Highly resilient, error-protected quantum gates in a solid-state quantum network node Poem, E. Cohen, M. I. Blum, S. Minin, D. Korn, D. Heifler, O. Maayani, S. Hamo, A. Bayn, I. Bar-Gill, N. Tordjman, M. Quantum Physics High-fidelity quantum gates are a cornerstone of any quantum computing and communications architecture. Realizing such control in the presence of realistic errors at the level required for beyond-threshold quantum error correction is a long-standing challenge for all quantum hardware platforms. Here we theoretically develop and experimentally demonstrate error-protected quantum gates in a solid-state quantum network node. Our work combines room-temperature randomized benchmarking with a new class of composite pulses that are simultaneously robust to frequency and amplitude, affecting random and systematic errors. We introduce Power-Unaffected, Doubly-Detuning-Insensitive Gates (PUDDINGs) -- a theoretical framework for constructing conditional gates with immunity to both amplitude and frequency errors. For single-qubit and two-qubit CNOT gate demonstrations in a solid-state nitrogen-vacancy (NV) center in diamond, we systematically measure an improvement in the error per gate up to a factor of 9. By projecting the application of PUDDING to cryogenic temperatures we show a record two-qubit error per gate of $1.2 \times 10^{-5}$, corresponding to a fidelity of $99.9988\%$, far below the thresholds required by surface and color code error correction. These results present viable building blocks for a new class of fault-tolerant quantum networks and represent the first experimental realization of error-protected conditional gates in solid-state systems. |
| title | Highly resilient, error-protected quantum gates in a solid-state quantum network node |
| topic | Quantum Physics |
| url | https://arxiv.org/abs/2512.05322 |