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Autori principali: Pavolotsky, Alexey, Joint, François, Manjunatha, Udupa Sujit, Belitsky, Victor, Meledin, Denis, Kojima, Takafumi, Masui, Sho, Narayanan, Ravishankar, Desmaris, Vincent
Natura: Preprint
Pubblicazione: 2025
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Accesso online:https://arxiv.org/abs/2512.06994
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author Pavolotsky, Alexey
Joint, François
Manjunatha, Udupa Sujit
Belitsky, Victor
Meledin, Denis
Kojima, Takafumi
Masui, Sho
Narayanan, Ravishankar
Desmaris, Vincent
author_facet Pavolotsky, Alexey
Joint, François
Manjunatha, Udupa Sujit
Belitsky, Victor
Meledin, Denis
Kojima, Takafumi
Masui, Sho
Narayanan, Ravishankar
Desmaris, Vincent
contents We report a Nb/Al-AlN /Nb superconducting tunnel junction process in which the AlN barrier is formed by plasma nitridation using a compact microwave electron-cyclotron-resonance (ECR) nitrogen plasma source integrated into a standard sputter cluster. This enables growth of uniform tunnel barriers across a broad range of specific resistances, with $R_n A$ down to $\approx 3,Ω,μ\mathrm{m}^2$. Junctions maintain excellent quality, exhibiting $R_j/R_n \ge 25$ at the highest barrier transparencies. We characterize resistivity, specific capacitance, and the evolution of junction parameters under room-temperature aging and thermal annealing. A consistent calibration of the junction specific capacitance $C_s$ versus $R_n A$ is established and independently validated by the performance of demonstrator SIS mixers designed using the extracted $C_s$.
format Preprint
id arxiv_https___arxiv_org_abs_2512_06994
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Fabrication and characterization of Nb/Al-AlN /Nb superconducting tunnel junctions
Pavolotsky, Alexey
Joint, François
Manjunatha, Udupa Sujit
Belitsky, Victor
Meledin, Denis
Kojima, Takafumi
Masui, Sho
Narayanan, Ravishankar
Desmaris, Vincent
Superconductivity
We report a Nb/Al-AlN /Nb superconducting tunnel junction process in which the AlN barrier is formed by plasma nitridation using a compact microwave electron-cyclotron-resonance (ECR) nitrogen plasma source integrated into a standard sputter cluster. This enables growth of uniform tunnel barriers across a broad range of specific resistances, with $R_n A$ down to $\approx 3,Ω,μ\mathrm{m}^2$. Junctions maintain excellent quality, exhibiting $R_j/R_n \ge 25$ at the highest barrier transparencies. We characterize resistivity, specific capacitance, and the evolution of junction parameters under room-temperature aging and thermal annealing. A consistent calibration of the junction specific capacitance $C_s$ versus $R_n A$ is established and independently validated by the performance of demonstrator SIS mixers designed using the extracted $C_s$.
title Fabrication and characterization of Nb/Al-AlN /Nb superconducting tunnel junctions
topic Superconductivity
url https://arxiv.org/abs/2512.06994