Towards Reliable Test-Time Adaptation: Style Invariance as a Correctness Likelihood

Fuente: arXiv

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Bibliographic Details
Main Authors:	Nam, Gilhyun, Kim, Taewon, Jeong, Joonhyun, Yang, Eunho
Format:	Preprint
Published:	2025
Subjects:	Machine Learning Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2512.07390