Dynamic Screening Effects on Auger Recombination in Metal-Halide Perovskites

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Hauptverfasser: Singh, Utkarsh, Simak, Sergei I.
Format: Preprint
Veröffentlicht: 2025
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author Singh, Utkarsh
Simak, Sergei I.
author_facet Singh, Utkarsh
Simak, Sergei I.
contents The performance of modern light-emitting technologies, from lasers to LEDs, is limited by nonradiative losses, with Auger recombination being the dominant channel at device-relevant carrier densities. Reliable modeling of this process is essential, yet conventional treatments neglect dynamic dielectric effects, limiting the predictive reliability at operating conditions. We develop a general framework that incorporates the frequency-dependent screened Coulomb interaction $W_{00}(\mathbf{q},ω)$, computed from low-scaling \textit{GW}, into both direct and phonon-assisted Auger amplitudes. Demonstrated on orthorhombic $γ$-CsPbI$_3$ (band gap $E_g\approx1.73$ eV) and $γ$-CsSnI$_3$ ($E_g\approx1.30$ eV), the approach shows that dynamic screening enhances the dielectric response, lowering the room-temperature Auger coefficient by $\sim$50-60 %. This renormalization shifts the crossover between radiative and nonradiative recombination by nearly a factor of two in carrier density. Dynamic dielectric screening thus emerges as a quantitative determinant of Auger recombination, offering a transferable framework for predictive modeling across polar semiconductors where frequency-independent screening models are inadequate.
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id arxiv_https___arxiv_org_abs_2512_07581
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Dynamic Screening Effects on Auger Recombination in Metal-Halide Perovskites
Singh, Utkarsh
Simak, Sergei I.
Materials Science
The performance of modern light-emitting technologies, from lasers to LEDs, is limited by nonradiative losses, with Auger recombination being the dominant channel at device-relevant carrier densities. Reliable modeling of this process is essential, yet conventional treatments neglect dynamic dielectric effects, limiting the predictive reliability at operating conditions. We develop a general framework that incorporates the frequency-dependent screened Coulomb interaction $W_{00}(\mathbf{q},ω)$, computed from low-scaling \textit{GW}, into both direct and phonon-assisted Auger amplitudes. Demonstrated on orthorhombic $γ$-CsPbI$_3$ (band gap $E_g\approx1.73$ eV) and $γ$-CsSnI$_3$ ($E_g\approx1.30$ eV), the approach shows that dynamic screening enhances the dielectric response, lowering the room-temperature Auger coefficient by $\sim$50-60 %. This renormalization shifts the crossover between radiative and nonradiative recombination by nearly a factor of two in carrier density. Dynamic dielectric screening thus emerges as a quantitative determinant of Auger recombination, offering a transferable framework for predictive modeling across polar semiconductors where frequency-independent screening models are inadequate.
title Dynamic Screening Effects on Auger Recombination in Metal-Halide Perovskites
topic Materials Science
url https://arxiv.org/abs/2512.07581