MBE obtained n-CdO:Eu p-Si heterojunctions -- electron beam induced profiling, electrical and structural properties

Fuente: arXiv

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Bibliographic Details
Main Authors:	Przezdziecka, E, Perlikowski, I, Chusnutdinow, S, Wierzbicka, A, Adhikari, A, Stachowicz, M, Jakiela, R, Zielony, E, Wojnar, P, Kozanecki, A
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2512.08587