Electron Emission Yield Datasets Under Electron Impact From Surfaces Characterized In Situ by XPS or AES

Fuente: arXiv

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Bibliographic Details
Main Authors:	Belhaj, M., dadouch, S.
Format:	Preprint
Published:	2025
Subjects:	Applied Physics Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2512.08693