A Physics-Constrained, Design-Driven Methodology for Defect Dataset Generation in Optical Lithography

Fuente: arXiv
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Bibliographic Details
Main Authors: Hu, Yuehua, Kong, Jiyeong, Shin, Dong-yeol, Kim, Jaekyun, Kang, Kyung-Tae
Format: Preprint
Published: 2025
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