APA-Zitierstil (7. Ausg.)

Gutierrez, N., Bravo, R. A., & Yelin, S. (2025). Enhanced Squeezing and Faster Metrology from Layered Quantum Neural Networks.

Chicago-Zitierstil (17. Ausg.)

Gutierrez, Nickholas, Rodrigo Araiza Bravo, und Susanne Yelin. Enhanced Squeezing and Faster Metrology from Layered Quantum Neural Networks. 2025.

MLA-Zitierstil (9. Ausg.)

Gutierrez, Nickholas, et al. Enhanced Squeezing and Faster Metrology from Layered Quantum Neural Networks. 2025.