Electrical Characterization of High-k (k>115) Crystalline SrTiO3 (STO) thin film integration with GaN with Nanomembrane Transfer Process

Fuente: arXiv

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Bibliographic Details
Main Authors:	Alam, Md Tahmidul, Lee, Kyoungjun, Wang, Guangying, Eom, Chang-beom, Gupta, Chirag
Format:	Preprint
Published:	2025
Subjects:	Materials Science Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2512.09391