High-resolution broadband characterization of resonance dispersion in an optical microresonator

Fuente: arXiv
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Hauptverfasser: Dalidet, Romain, Bensemhoun, Adrien, Sauder, Gregory, Martin, Anthony, Medina, David, Ramos, Carlos Alonso, Cassan, Eric, Vivien, Laurent, Tovar, Jonathan Faugier, Routier, Baptiste, Wilmart, Quentin, Olivier, Ségolène, Auria, Virginia D, Labonté, Laurent, Tanzilli, Sébastien
Format: Preprint
Veröffentlicht: 2025
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author Dalidet, Romain
Bensemhoun, Adrien
Sauder, Gregory
Martin, Anthony
Medina, David
Ramos, Carlos Alonso
Cassan, Eric
Vivien, Laurent
Tovar, Jonathan Faugier
Routier, Baptiste
Wilmart, Quentin
Olivier, Ségolène
Auria, Virginia D
Labonté, Laurent
Tanzilli, Sébastien
author_facet Dalidet, Romain
Bensemhoun, Adrien
Sauder, Gregory
Martin, Anthony
Medina, David
Ramos, Carlos Alonso
Cassan, Eric
Vivien, Laurent
Tovar, Jonathan Faugier
Routier, Baptiste
Wilmart, Quentin
Olivier, Ségolène
Auria, Virginia D
Labonté, Laurent
Tanzilli, Sébastien
contents Accurate knowledge of the uneven free spectral range of an optical microresonator, which provides direct insight into group velocity dispersion, is essential for understanding and controlling Kerr frequency comb dynamics. In this work, we present a simple and highly precise method formeasuring the free spectral range over a 5 THz bandwidth in silicon nitride microresonators, leveraging a wavemeter with 0.4 MHz resolution. Our fully fibered plug-and-play experimental setup enables the accurate extraction of resonance frequencies. By carefully analyzing the spectral position of each resonance, we measure both second- and third-order free spectral range expansion coefficients. This approach offers a robust and accessible tool for dispersion characterization in integrated photonic circuits, paving the way for next-generation of Kerr comb sources and quantum photonic technologies.
format Preprint
id arxiv_https___arxiv_org_abs_2512_09475
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle High-resolution broadband characterization of resonance dispersion in an optical microresonator
Dalidet, Romain
Bensemhoun, Adrien
Sauder, Gregory
Martin, Anthony
Medina, David
Ramos, Carlos Alonso
Cassan, Eric
Vivien, Laurent
Tovar, Jonathan Faugier
Routier, Baptiste
Wilmart, Quentin
Olivier, Ségolène
Auria, Virginia D
Labonté, Laurent
Tanzilli, Sébastien
Optics
Quantum Physics
Accurate knowledge of the uneven free spectral range of an optical microresonator, which provides direct insight into group velocity dispersion, is essential for understanding and controlling Kerr frequency comb dynamics. In this work, we present a simple and highly precise method formeasuring the free spectral range over a 5 THz bandwidth in silicon nitride microresonators, leveraging a wavemeter with 0.4 MHz resolution. Our fully fibered plug-and-play experimental setup enables the accurate extraction of resonance frequencies. By carefully analyzing the spectral position of each resonance, we measure both second- and third-order free spectral range expansion coefficients. This approach offers a robust and accessible tool for dispersion characterization in integrated photonic circuits, paving the way for next-generation of Kerr comb sources and quantum photonic technologies.
title High-resolution broadband characterization of resonance dispersion in an optical microresonator
topic Optics
Quantum Physics
url https://arxiv.org/abs/2512.09475