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Hauptverfasser: Tsiamis, Andreas, Stathopoulos, Spyros, Prodromakis, Themis
Format: Preprint
Veröffentlicht: 2025
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Online-Zugang:https://arxiv.org/abs/2512.09791
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author Tsiamis, Andreas
Stathopoulos, Spyros
Prodromakis, Themis
author_facet Tsiamis, Andreas
Stathopoulos, Spyros
Prodromakis, Themis
contents Moore's law has long served the semiconductor industry as the driving force for producing ever-advancing electronics technologies. However, given the economic implications and technological challenges associated with the present semiconductor scaling constraints, a shift from a traditional more Moore approach to a beyond Moore paradigm is desirable for sustaining the current pace of innovation beyond the established development route. Resistive random-access memories (RRAM) are one such beyond Moore technology that offers many avenues for innovation, and when integrated with mature complementary metal oxide semiconductors (CMOS), can extend CMOS capabilities in a scalable and power-efficient manner, both in terms of memory and computation. Nevertheless, as emerging and established technologies fuse, existing semiconductor-optimised manufacturing faces significant challenges, while the methodologies and complexities of integration are often not highlighted in depth, or overlooked at the expense of demonstrating the application-specific integrated-technologies. In this article, we focus on the integration, and detail a cost-effective, rapid-prototyping, and technology agnostic CMOS-RRAM integration strategy that employs hybridised wafer-level and multi-reticle processing techniques, supported by a systematic increased complexity approach. Leveraging the fact that CMOS technologies can be readily realised by taking advantage of mature front-end-of-line fabrication processes offered by semiconductor foundries, we establish an in-house RRAM development program that allows to combine fundamental material and device-level knowledge with custom-designed CMOS electronics. This approach utilises fully CMOS-compatible and transferable processes, ultimately enabling a seamless transition from research and development to volume production.
format Preprint
id arxiv_https___arxiv_org_abs_2512_09791
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle A Rapid-prototyping CMOS-RRAM Integration Strategy
Tsiamis, Andreas
Stathopoulos, Spyros
Prodromakis, Themis
Materials Science
Other Condensed Matter
Moore's law has long served the semiconductor industry as the driving force for producing ever-advancing electronics technologies. However, given the economic implications and technological challenges associated with the present semiconductor scaling constraints, a shift from a traditional more Moore approach to a beyond Moore paradigm is desirable for sustaining the current pace of innovation beyond the established development route. Resistive random-access memories (RRAM) are one such beyond Moore technology that offers many avenues for innovation, and when integrated with mature complementary metal oxide semiconductors (CMOS), can extend CMOS capabilities in a scalable and power-efficient manner, both in terms of memory and computation. Nevertheless, as emerging and established technologies fuse, existing semiconductor-optimised manufacturing faces significant challenges, while the methodologies and complexities of integration are often not highlighted in depth, or overlooked at the expense of demonstrating the application-specific integrated-technologies. In this article, we focus on the integration, and detail a cost-effective, rapid-prototyping, and technology agnostic CMOS-RRAM integration strategy that employs hybridised wafer-level and multi-reticle processing techniques, supported by a systematic increased complexity approach. Leveraging the fact that CMOS technologies can be readily realised by taking advantage of mature front-end-of-line fabrication processes offered by semiconductor foundries, we establish an in-house RRAM development program that allows to combine fundamental material and device-level knowledge with custom-designed CMOS electronics. This approach utilises fully CMOS-compatible and transferable processes, ultimately enabling a seamless transition from research and development to volume production.
title A Rapid-prototyping CMOS-RRAM Integration Strategy
topic Materials Science
Other Condensed Matter
url https://arxiv.org/abs/2512.09791