Characterizing second-order topological insulators via entanglement topological invariant in two-dimensional systems
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arXiv
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| Auteurs principaux: | , , , , |
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| Format: | Preprint |
| Publié: |
2025
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| _version_ | 1866911312523558912 |
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| author | Zhang, Yu-Long Miao, Cheng-Ming Sun, Qing-Feng Liu, Jian-Jun Zhang, Ying-Tao |
| author_facet | Zhang, Yu-Long Miao, Cheng-Ming Sun, Qing-Feng Liu, Jian-Jun Zhang, Ying-Tao |
| contents | Higher-order topological insulators have attracted significant interest in recent years. However, identifying a universal topological invariant capable of characterizing higher-order topology remains challenging. Here, we propose a entanglement topological invariant designed to characterize secondorder topological systems. This entanglement topological invariant captures the entanglement of topological corner states under open boundary conditions by employing a bipartite entanglement entropy method. In several representative models, the entanglement topological invariant assumes a nonzero value exclusively in the presence of second-order topology, with its magnitude exactly matching the number of topologically protected corner states. Consequently, the proposed entanglement topological invariant not only provides a clear criterion for detecting higher-order topology, but also offers a quantitative measure for the related corner states. Our study establishes a universal and precise method for characterizing higher-order topological phases, opening avenues for their fundamental understanding and future investigations. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2512_09962 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Characterizing second-order topological insulators via entanglement topological invariant in two-dimensional systems Zhang, Yu-Long Miao, Cheng-Ming Sun, Qing-Feng Liu, Jian-Jun Zhang, Ying-Tao Mesoscale and Nanoscale Physics Higher-order topological insulators have attracted significant interest in recent years. However, identifying a universal topological invariant capable of characterizing higher-order topology remains challenging. Here, we propose a entanglement topological invariant designed to characterize secondorder topological systems. This entanglement topological invariant captures the entanglement of topological corner states under open boundary conditions by employing a bipartite entanglement entropy method. In several representative models, the entanglement topological invariant assumes a nonzero value exclusively in the presence of second-order topology, with its magnitude exactly matching the number of topologically protected corner states. Consequently, the proposed entanglement topological invariant not only provides a clear criterion for detecting higher-order topology, but also offers a quantitative measure for the related corner states. Our study establishes a universal and precise method for characterizing higher-order topological phases, opening avenues for their fundamental understanding and future investigations. |
| title | Characterizing second-order topological insulators via entanglement topological invariant in two-dimensional systems |
| topic | Mesoscale and Nanoscale Physics |
| url | https://arxiv.org/abs/2512.09962 |