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Characterization of CRYO ASIC for charge readout in the nEXO experiment

Fuente: arXiv

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Hauptverfasser:	Li, Z., Yu, M., Angelico, E., Atencio, A., Gupta, A., Knauss, P., Pena-Perez, A., Lenardo, B. G., Acharya, P., Amy, A., Anker, A., Arnquist, I. J., Bane, J., Belov, V., Bhatta, T., Bolotnikov, A., Breslin, J., Breur, P. A., Brodsky, J. P., Brown, E., Brunner, T., Burnell, B., Caden, E., Cao, G. F., Cao, L. Q., Cesmecioglu, D., Chernyak, D., Chiu, M., Collister, R., Marquis, M., Daniels, T., Darroch, L., DeVoe, R., di Vacri, M. L., Defay, X., Ding, Y. Y., Doering, D., Dolinski, M. J., Dragone, A., Eckert, B., Emara, A., Fatemighomi, N., Fairbank, W., Foust, B. T., Gallacher, D., Gallice, N., Gaur, A., Gillis, W., Girard, F., Gorham, A., Gracequist, K., Gratta, G., Hardy, C. A., Hasi, J., Hedges, S., Heffner, M., Hein, E., Herrera, H. Hernandez, Holt, J. D., Iverson, A., Jiang, X. S., Karelin, A., Keblbeck, D., Kenney, C., Kotov, I., Kuchenkov, A., Kumar, K. S., Lavoie, S., Larson, A., Latif, M. B., Leach, K. G., Leonard, D. S., Lessard, G., Leung, K. K. H., Li, G., Li, X., Licciardi, C., Lindsay, R., MacLellan, R., Majidi, S., Malbrunot, C., Markovic, B., Masbou, J., Medina-Peregrina, M., Mngonyama, S., Mong, B., Moore, D. C., Ni, K., Nitu, I., Nolan, A., Nowicki, S. C., Ondze, J. C. Nzobadila, Odian, A., Orrell, J. L., Ortega, G. S., Pagani, L., Smalley, H. Peltz, Piepke, A., Pocar, A., Prentice, S., Radeka, V., Raguzin, E., Rai, R., Rasiwala, H., Ray, D., Reese, B., Rescia, S., Retiere, F., Richardson, G., Riot, V., Ross, R., Rota, L., Rowson, P. C., Saldanha, R., Sangiorgio, S., Sekula, S., Shetty, T., Si, L., Spadoni, F., Stekhanov, V., Sun, X. L., Thibado, S., Totev, T., Triambak, S., Tsang, R. H. M., Tyuka, O. A., John, T. Vallivilayil, van Bruggen, E., Vidal, M., Viel, S., Walent, M., Wang, H., Wang, Q. D., Watts, M., Wei, W., Wehrfritz, M., Wen, L. J., Wilde, S., Wu, X. M., Xu, H., Yang, H. B., Yang, L., Zeldovich, O., Zhao, J.
Format:	Preprint
Veröffentlicht:	2025
Schlagworte:	Instrumentation and Detectors Nuclear Experiment
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_version_	1866912759694753792
author	Li, Z. Yu, M. Angelico, E. Atencio, A. Gupta, A. Knauss, P. Pena-Perez, A. Lenardo, B. G. Acharya, P. Amy, A. Anker, A. Arnquist, I. J. Bane, J. Belov, V. Bhatta, T. Bolotnikov, A. Breslin, J. Breur, P. A. Brodsky, J. P. Brown, E. Brunner, T. Burnell, B. Caden, E. Cao, G. F. Cao, L. Q. Cesmecioglu, D. Chernyak, D. Chiu, M. Collister, R. Marquis, M. Daniels, T. Darroch, L. DeVoe, R. di Vacri, M. L. Defay, X. Ding, Y. Y. Doering, D. Dolinski, M. J. Dragone, A. Eckert, B. Emara, A. Fatemighomi, N. Fairbank, W. Foust, B. T. Gallacher, D. Gallice, N. Gaur, A. Gillis, W. Girard, F. Gorham, A. Gracequist, K. Gratta, G. Hardy, C. A. Hasi, J. Hedges, S. Heffner, M. Hein, E. Herrera, H. Hernandez Holt, J. D. Iverson, A. Jiang, X. S. Karelin, A. Keblbeck, D. Kenney, C. Kotov, I. Kuchenkov, A. Kumar, K. S. Lavoie, S. Larson, A. Latif, M. B. Leach, K. G. Leonard, D. S. Lessard, G. Leung, K. K. H. Li, G. Li, X. Licciardi, C. Lindsay, R. MacLellan, R. Majidi, S. Malbrunot, C. Markovic, B. Masbou, J. Medina-Peregrina, M. Mngonyama, S. Mong, B. Moore, D. C. Ni, K. Nitu, I. Nolan, A. Nowicki, S. C. Ondze, J. C. Nzobadila Odian, A. Orrell, J. L. Ortega, G. S. Pagani, L. Smalley, H. Peltz Piepke, A. Pocar, A. Prentice, S. Radeka, V. Raguzin, E. Rai, R. Rasiwala, H. Ray, D. Reese, B. Rescia, S. Retiere, F. Richardson, G. Riot, V. Ross, R. Rota, L. Rowson, P. C. Saldanha, R. Sangiorgio, S. Sekula, S. Shetty, T. Si, L. Spadoni, F. Stekhanov, V. Sun, X. L. Thibado, S. Totev, T. Triambak, S. Tsang, R. H. M. Tyuka, O. A. John, T. Vallivilayil van Bruggen, E. Vidal, M. Viel, S. Walent, M. Wang, H. Wang, Q. D. Watts, M. Wei, W. Wehrfritz, M. Wen, L. J. Wilde, S. Wu, X. M. Xu, H. Yang, H. B. Yang, L. Zeldovich, O. Zhao, J.
author_facet	Li, Z. Yu, M. Angelico, E. Atencio, A. Gupta, A. Knauss, P. Pena-Perez, A. Lenardo, B. G. Acharya, P. Amy, A. Anker, A. Arnquist, I. J. Bane, J. Belov, V. Bhatta, T. Bolotnikov, A. Breslin, J. Breur, P. A. Brodsky, J. P. Brown, E. Brunner, T. Burnell, B. Caden, E. Cao, G. F. Cao, L. Q. Cesmecioglu, D. Chernyak, D. Chiu, M. Collister, R. Marquis, M. Daniels, T. Darroch, L. DeVoe, R. di Vacri, M. L. Defay, X. Ding, Y. Y. Doering, D. Dolinski, M. J. Dragone, A. Eckert, B. Emara, A. Fatemighomi, N. Fairbank, W. Foust, B. T. Gallacher, D. Gallice, N. Gaur, A. Gillis, W. Girard, F. Gorham, A. Gracequist, K. Gratta, G. Hardy, C. A. Hasi, J. Hedges, S. Heffner, M. Hein, E. Herrera, H. Hernandez Holt, J. D. Iverson, A. Jiang, X. S. Karelin, A. Keblbeck, D. Kenney, C. Kotov, I. Kuchenkov, A. Kumar, K. S. Lavoie, S. Larson, A. Latif, M. B. Leach, K. G. Leonard, D. S. Lessard, G. Leung, K. K. H. Li, G. Li, X. Licciardi, C. Lindsay, R. MacLellan, R. Majidi, S. Malbrunot, C. Markovic, B. Masbou, J. Medina-Peregrina, M. Mngonyama, S. Mong, B. Moore, D. C. Ni, K. Nitu, I. Nolan, A. Nowicki, S. C. Ondze, J. C. Nzobadila Odian, A. Orrell, J. L. Ortega, G. S. Pagani, L. Smalley, H. Peltz Piepke, A. Pocar, A. Prentice, S. Radeka, V. Raguzin, E. Rai, R. Rasiwala, H. Ray, D. Reese, B. Rescia, S. Retiere, F. Richardson, G. Riot, V. Ross, R. Rota, L. Rowson, P. C. Saldanha, R. Sangiorgio, S. Sekula, S. Shetty, T. Si, L. Spadoni, F. Stekhanov, V. Sun, X. L. Thibado, S. Totev, T. Triambak, S. Tsang, R. H. M. Tyuka, O. A. John, T. Vallivilayil van Bruggen, E. Vidal, M. Viel, S. Walent, M. Wang, H. Wang, Q. D. Watts, M. Wei, W. Wehrfritz, M. Wen, L. J. Wilde, S. Wu, X. M. Xu, H. Yang, H. B. Yang, L. Zeldovich, O. Zhao, J.
contents	nEXO is a proposed next-generation experiment searching for the neutrinoless double beta decay of $^{136}$Xe using a tonne-scale liquid xenon (LXe) time projection chamber (TPC). To image the ionization signals from events in the liquid xenon, the detector will employ metallized fused-silica charge collection tiles instrumented with cryogenic application-specific integrated circuits (ASICs), referred to as CRYO ASIC, which are designed to operate directly in LXe to minimize input capacitance and pick-up noise. Here we present the performance of the CRYO ASIC mounted on an auxiliary printed circuit board and evaluated both in a cryogenic environmental chamber and in a dedicated LXe test stand. We demonstrate that the ASICs achieve the desired performance at liquid xenon temperatures, showing a gain stability better than 0.2% over 24-hour operation and reliable in-situ calibration using an on-chip pulser. In the LXe test stand, we show that boiling caused by the chip heat dissipation can be mitigated by operating the system above ~0.1 MPa. The in-LXe noise measured agrees with simulation, which indicates it the $150~e^-$ design requirement can be satisfied. These results establish CRYO ASIC as a viable low-noise in-LXe charge readout solution for nEXO.
format	Preprint
id	arxiv_https___arxiv_org_abs_2512_11116
institution	arXiv
publishDate	2025
record_format	arxiv
spellingShingle	Characterization of CRYO ASIC for charge readout in the nEXO experiment Li, Z. Yu, M. Angelico, E. Atencio, A. Gupta, A. Knauss, P. Pena-Perez, A. Lenardo, B. G. Acharya, P. Amy, A. Anker, A. Arnquist, I. J. Bane, J. Belov, V. Bhatta, T. Bolotnikov, A. Breslin, J. Breur, P. A. Brodsky, J. P. Brown, E. Brunner, T. Burnell, B. Caden, E. Cao, G. F. Cao, L. Q. Cesmecioglu, D. Chernyak, D. Chiu, M. Collister, R. Marquis, M. Daniels, T. Darroch, L. DeVoe, R. di Vacri, M. L. Defay, X. Ding, Y. Y. Doering, D. Dolinski, M. J. Dragone, A. Eckert, B. Emara, A. Fatemighomi, N. Fairbank, W. Foust, B. T. Gallacher, D. Gallice, N. Gaur, A. Gillis, W. Girard, F. Gorham, A. Gracequist, K. Gratta, G. Hardy, C. A. Hasi, J. Hedges, S. Heffner, M. Hein, E. Herrera, H. Hernandez Holt, J. D. Iverson, A. Jiang, X. S. Karelin, A. Keblbeck, D. Kenney, C. Kotov, I. Kuchenkov, A. Kumar, K. S. Lavoie, S. Larson, A. Latif, M. B. Leach, K. G. Leonard, D. S. Lessard, G. Leung, K. K. H. Li, G. Li, X. Licciardi, C. Lindsay, R. MacLellan, R. Majidi, S. Malbrunot, C. Markovic, B. Masbou, J. Medina-Peregrina, M. Mngonyama, S. Mong, B. Moore, D. C. Ni, K. Nitu, I. Nolan, A. Nowicki, S. C. Ondze, J. C. Nzobadila Odian, A. Orrell, J. L. Ortega, G. S. Pagani, L. Smalley, H. Peltz Piepke, A. Pocar, A. Prentice, S. Radeka, V. Raguzin, E. Rai, R. Rasiwala, H. Ray, D. Reese, B. Rescia, S. Retiere, F. Richardson, G. Riot, V. Ross, R. Rota, L. Rowson, P. C. Saldanha, R. Sangiorgio, S. Sekula, S. Shetty, T. Si, L. Spadoni, F. Stekhanov, V. Sun, X. L. Thibado, S. Totev, T. Triambak, S. Tsang, R. H. M. Tyuka, O. A. John, T. Vallivilayil van Bruggen, E. Vidal, M. Viel, S. Walent, M. Wang, H. Wang, Q. D. Watts, M. Wei, W. Wehrfritz, M. Wen, L. J. Wilde, S. Wu, X. M. Xu, H. Yang, H. B. Yang, L. Zeldovich, O. Zhao, J. Instrumentation and Detectors Nuclear Experiment nEXO is a proposed next-generation experiment searching for the neutrinoless double beta decay of $^{136}$Xe using a tonne-scale liquid xenon (LXe) time projection chamber (TPC). To image the ionization signals from events in the liquid xenon, the detector will employ metallized fused-silica charge collection tiles instrumented with cryogenic application-specific integrated circuits (ASICs), referred to as CRYO ASIC, which are designed to operate directly in LXe to minimize input capacitance and pick-up noise. Here we present the performance of the CRYO ASIC mounted on an auxiliary printed circuit board and evaluated both in a cryogenic environmental chamber and in a dedicated LXe test stand. We demonstrate that the ASICs achieve the desired performance at liquid xenon temperatures, showing a gain stability better than 0.2% over 24-hour operation and reliable in-situ calibration using an on-chip pulser. In the LXe test stand, we show that boiling caused by the chip heat dissipation can be mitigated by operating the system above ~0.1 MPa. The in-LXe noise measured agrees with simulation, which indicates it the $150~e^-$ design requirement can be satisfied. These results establish CRYO ASIC as a viable low-noise in-LXe charge readout solution for nEXO.
title	Characterization of CRYO ASIC for charge readout in the nEXO experiment
topic	Instrumentation and Detectors Nuclear Experiment
url	https://arxiv.org/abs/2512.11116