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Bibliographic Details
Main Authors: Feldman, William M, Kim, Inwon C
Format: Preprint
Published: 2025
Subjects:
Online Access:https://arxiv.org/abs/2512.11152
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_version_ 1866912759728308224
author Feldman, William M
Kim, Inwon C
author_facet Feldman, William M
Kim, Inwon C
contents We consider the Bernoulli free boundary problem with ``defects", inhomogeneities in the coefficients of compact support. When the defects are small and arrayed periodically there exist plane-like solutions with a range of large-scale slopes slightly different from the background field value. This is known as pinning. By studying the capacity-like pinning effect of a single defect in the Bernoulli free boundary problem, we can compute the asymptotic expansion of the interval of pinned slopes as the defect size goes to zero for lattice aligned normal directions. Our work is motivated by the issue of contact angle hysteresis in capillary contact lines.
format Preprint
id arxiv_https___arxiv_org_abs_2512_11152
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle The pinning effect of dilute defects
Feldman, William M
Kim, Inwon C
Analysis of PDEs
We consider the Bernoulli free boundary problem with ``defects", inhomogeneities in the coefficients of compact support. When the defects are small and arrayed periodically there exist plane-like solutions with a range of large-scale slopes slightly different from the background field value. This is known as pinning. By studying the capacity-like pinning effect of a single defect in the Bernoulli free boundary problem, we can compute the asymptotic expansion of the interval of pinned slopes as the defect size goes to zero for lattice aligned normal directions. Our work is motivated by the issue of contact angle hysteresis in capillary contact lines.
title The pinning effect of dilute defects
topic Analysis of PDEs
url https://arxiv.org/abs/2512.11152