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Main Authors: Wang, Qishan, Wang, Haofeng, Gao, Shuyong, Guo, Jia, Xiong, Li, Li, Jiaqi, Bai, Dengxuan, Zhang, Wenqiang
Format: Preprint
Published: 2025
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Online Access:https://arxiv.org/abs/2512.11401
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author Wang, Qishan
Wang, Haofeng
Gao, Shuyong
Guo, Jia
Xiong, Li
Li, Jiaqi
Bai, Dengxuan
Zhang, Wenqiang
author_facet Wang, Qishan
Wang, Haofeng
Gao, Shuyong
Guo, Jia
Xiong, Li
Li, Jiaqi
Bai, Dengxuan
Zhang, Wenqiang
contents Industrial anomaly detection is a challenging open-set task that aims to identify unknown anomalous patterns deviating from normal data distribution. To avoid the significant memory consumption and limited generalizability brought by building separate models per class, we focus on developing a unified framework for multi-class anomaly detection. However, under this challenging setting, conventional reconstruction-based networks often suffer from an identity mapping problem, where they directly replicate input features regardless of whether they are normal or anomalous, resulting in detection failures. To address this issue, this study proposes a novel framework termed Collaborative Reconstruction and Repair (CRR), which transforms the reconstruction to repairation. First, we optimize the decoder to reconstruct normal samples while repairing synthesized anomalies. Consequently, it generates distinct representations for anomalous regions and similar representations for normal areas compared to the encoder's output. Second, we implement feature-level random masking to ensure that the representations from decoder contain sufficient local information. Finally, to minimize detection errors arising from the discrepancies between feature representations from the encoder and decoder, we train a segmentation network supervised by synthetic anomaly masks, thereby enhancing localization performance. Extensive experiments on industrial datasets that CRR effectively mitigates the identity mapping issue and achieves state-of-the-art performance in multi-class industrial anomaly detection.
format Preprint
id arxiv_https___arxiv_org_abs_2512_11401
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Collaborative Reconstruction and Repair for Multi-class Industrial Anomaly Detection
Wang, Qishan
Wang, Haofeng
Gao, Shuyong
Guo, Jia
Xiong, Li
Li, Jiaqi
Bai, Dengxuan
Zhang, Wenqiang
Computer Vision and Pattern Recognition
Industrial anomaly detection is a challenging open-set task that aims to identify unknown anomalous patterns deviating from normal data distribution. To avoid the significant memory consumption and limited generalizability brought by building separate models per class, we focus on developing a unified framework for multi-class anomaly detection. However, under this challenging setting, conventional reconstruction-based networks often suffer from an identity mapping problem, where they directly replicate input features regardless of whether they are normal or anomalous, resulting in detection failures. To address this issue, this study proposes a novel framework termed Collaborative Reconstruction and Repair (CRR), which transforms the reconstruction to repairation. First, we optimize the decoder to reconstruct normal samples while repairing synthesized anomalies. Consequently, it generates distinct representations for anomalous regions and similar representations for normal areas compared to the encoder's output. Second, we implement feature-level random masking to ensure that the representations from decoder contain sufficient local information. Finally, to minimize detection errors arising from the discrepancies between feature representations from the encoder and decoder, we train a segmentation network supervised by synthetic anomaly masks, thereby enhancing localization performance. Extensive experiments on industrial datasets that CRR effectively mitigates the identity mapping issue and achieves state-of-the-art performance in multi-class industrial anomaly detection.
title Collaborative Reconstruction and Repair for Multi-class Industrial Anomaly Detection
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2512.11401