Nath, S. (2025). A Comparative Analysis of Semiconductor Wafer Map Defect Detection with Image Transformer.
Citazione stile Chigago Style (17a edizione)Nath, Sushmita. A Comparative Analysis of Semiconductor Wafer Map Defect Detection with Image Transformer. 2025.
Citatione MLA (9a ed.)Nath, Sushmita. A Comparative Analysis of Semiconductor Wafer Map Defect Detection with Image Transformer. 2025.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.