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Influence of Radiation and AC Coupling on Time Performance of Analog Pixels Test Structures in 65 nm CMOS technology

Fuente: arXiv

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Bibliographic Details
Main Authors:	Rinella, Gianluca Aglieri, Aglietta, Luca, Antonelli, Matias, Barile, Francesco, Benotto, Franco, Beole, Stefania Maria, Botta, Elena, Bruno, Giuseppe Eugenio, Colella, Domenico, Colelli, Angelo, Contin, Giacomo, De Robertis, Giuseppe, Dumitrache, Floarea, Elia, Domenico, Ferrero, Chiara, Fransen, Martin, Grelli, Alessandro, Hillemanns, Hartmut, Hobus, Isis, Kluge, Alex, Kumar, Shyam, Lemoine, Corentin, Licciulli, Francesco, Lim, Bong-Hwi, Loddo, Flavio, Bilo, Esther Mwetaminwa M, Mager, Magnus, Marras, Davide, Martinengo, Paolo, Pastore, Cosimo, Patra, Rajendra Nath, Perciballi, Stefania, Piro, Francesco, Prino, Francesco, Ramello, Luciano, Reidt, Felix, Russo, Roberto, Sarritzu, Valerio, Savino, Umberto, Senyukov, Serhiy, Sitta, Mario, Snoeys, Walter, Sonneveld, Jory, Suljic, Miljenko, Triloki, Triloki, Usai, Gianluca, Wennlof, Haakan
Format:	Preprint
Published:	2025
Subjects:	Instrumentation and Detectors Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2512.13339