Nucleation suppression by charge screening on grain boundaries: a kinetic model for bulk imprint in polycrystalline ferroelectric thin films

Fuente: arXiv

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Bibliographic Details
Main Authors:	Tian, Huanhuan, Yang, Jianguo, Liu, Ming
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2512.13748